Your search for Keyword "grain tracking"resulted in 1 record.
- Title: Microstructure-based analysis of cone penetration tests in snow
- Date: 2018-10-07
- Authors: Isabel Peinke, Pascal Hagenmuller, Edward Andò, Frédéric Flin, Guillaume Chambon, Jacques Roulle
- Description: Cone penetration tests (CPT) are common to measure vertical profiles of the snow hardness. The SnowMicroPenetrometer (SMP) is a high-resolution CPT, w...
- Object ID: ISSW2018_P10.10.pdf
- Keywords: snow microstructure, x-ray tomography, grain tracking, snowmicropenetrometer
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